X-ray Devices

Rigaku SmartLab 9 kW is a general purpose XRD system which can be used in diffraction studies of powders, thin films, and solid objects with various sizes. System has a unique five-axis θ-θ goniometer which enables many kinds of diffraction experiments. Detector arm of the diffractometer can be rotated perpendicularly related to the out-of-plane diffraction plane which enables diffraction studies of the crystal planes which are perpendicular to the plane of the specimen (e.g. ultra-thin films) and also in-plane texture measurements in which the specimen does not need to be tilted.

The system is also equipped with a high-temperature furnace. XRD measurements can be performed in the temperature range between RT and 1100 °C in air, vacuum, and nitrogen/argon atmospheres. In-plane texture measurements in the high temperatures are also possible.

• High performance XRD system with 9 kW rotating anode x-ray generator
• Anodes: Co and Cu
• Cross Beam Optics (CBO): Parallel Beam (PB) and Bragg-Brentano (BB) optics
• CBO-f Polycapillary Microfocus Optics for CBO (400 µm x-ray spot)
• Detectors: 1D solid state detector and scintillator
• Vertical θ/θ 4-circle goniometer with Eulerian cradle
• The in-plane diffraction measurement option for measuring of planes perpendicular to the sample surface. Optimal e.g. analysis of ultra-thin films.
• Anton Paar DHS1100 furnace for in-situ XRD experiments (RT-1100 ⁰C)
• Atmospheres: Air, Ar, N2, vacuum
• Software: SmartLab Guidance (diffractometer control software), PDXL2 (Analysis incl. Rietveld), ICDD PDF4+ 2015 (database of powder diffraction patterns), 3DExplore (Texture analysis)
  
  

Bruker D8 VENTURE is a versatile SCXRD instrument for accurate 3D crystal structure analysis of solid materials. In addition to crystal structure, the measurements also provide information on the electron structure and intermolecular interactions of the material under investigation. The instrument is equipped with two high brightness X-ray microfocus sources (Mo and Cu) and a sample cooling system, which allows the analysis of many types of materials.

In addition to single crystals, the instrument can perform powder diffraction measurements in transmission mode for very small amounts of powder. The collected high-resolution diffraction data enables the pair distribution function (PDF) analysis of the powder samples. The system is equipped with an automatic sample changer, which allows the prescreening of single crystal samples for SCXRD measurements. The sample changer can also be used for automated measurements of powder samples.

• High performance SCXRD system for structure analysis of single crystals and high-resolution measurements of powder samples
• Two high brightness X-ray microfocus sources (Mo and Cu)
• Large area X-ray detector with high dynamic range (PHOTON III 14)
• High precision KAPPA goniometer
• Automated goniometer head for fast sample alignment
• Low temperature device for sample cooling (80-400 K) (Oxford Cryosystems Cryostream 1000)
• Automatic stage for single crystal sample screening and measuring powder samples in transmission mode
• Versatile software for SCXRD data analysis and solving crystal structures (Apex 5) and powder diffraction data analysis (DIFFRAC.TOPAS)

PANalytical Axios max 4kW is an effective general purpose XRF apparatus capable of measuring many different sample types. The instrument has an automatic sample changer system for effective processing of large amounts of samples.

The XRF can measure elements from fluoride to uranium. Carbon and sulfur concentrations can be measured with dedicated Leco CS230 CS-analyzer.

The instrument can analyze various materials e.g., metals, minerals, ashes, catalysts, cement, slags, industrial residue materials, soil samples, plastics, and ceramics. Quantitative analysis programs based on certified reference materials for steels, minerals, ores, catalysts support materials, and plant samples (pine needles, lichen, moss) are available.

Powder, solid, and liquid samples can be measured. The CMA has also PANalytical Eagon2 automatic fusion machine for preparation of glass disk XRF samples.

• Elemental analysis from fluoride to uranium
• Smallest detectable element concentration: 100-300 ppm (F-Cl), 5-30 ppm (heavier elements)
• Automatic sample changer for 16 samples
• Analysis of biological and geological powder samples
• Powder, fused, solid, and liquid samples

ESCALAB 250Xi is a high-performance XPS system, which can measure many kinds of samples. Sample materials can be organics, inorganics, insulators, conductors, solids, and powders. Usually, no special sample preparation is required. The main limitation for the sample is the ultra-high vacuum (UHV) environment which requires that no significant outgassing takes place during the measurement.

The XPS signal is collected only from the top 1-10 nm from the sample surface, which makes the method extremely surface sensitive and enables the accurate surface chemical studies. For the chemical depth profiling the system is equipped with Ar+-mono/cluster ion gun, which can effectively sputter both organic and inorganic materials. Very thin surface layers can be depth profiled by using the angular resolved XPS (ARXPS).

ESCALAB 250Xi is equipped with other surface chemical analysis methods which are ultraviolet photoelectron spectroscopy (UPS), reflection electron energy loss spectroscopy (REELS), and ion scattering spectroscopy (ISS).

• Non-destructive method
• Surface sensitive (1-10 nm)
• Samples can be organics, inorganics, insulators, conductors, solids, and powders
• Elemental analysis from lithium to uranium
• Smallest detectable element concentration: 100-1000 ppm
• Ar+-mono/cluster ion gun for chemical depth profiling of both organic and inorganic materials
• Sample heating and cooling
• ARXPS
• UPS
• REELS
• ISS

Microscopes large sample stage enables imaging of large samples.

• Imaging resolution: < 1 µm
• Maximum sample size: 610 mm x 508 mm
• Maximum sample weight: 5 kg